PRECISE DIELECTRIC MEASUREMENTS OF LOW-LOSS MATERIALS AT MILLIMETER AND SUBMILLIMETER WAVELENGTHS

被引：1
|
作者：
AFSAR, MN [1 ]
CHANTRY, GW [1 ]
机构：
[1] NATL PHYS LAB,DIV ELECT SCI,TEDDINGTON TW11 OLW,MIDDLESEX,ENGLAND
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1977年 / 25卷 / 06期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：508 / 511
页数：4
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