ELECTROSTATIC PROPERTIES FROM ACCURATE X-RAY-DIFFRACTION DATA

被引：0

作者：

EICHHORN, K ^{[1
]}

机构：

[1] UNIV SAARLAND,FACHRICHTUNG KRISTALLOG,D-6600 SAARBRUCKEN,FED REP GER

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1984年 / 40卷

关键词：

D O I：

10.1107/S0108767384094526

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：C178 / C178

页数：1

共 50 条

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