DETERMINATION OF ELECTRON DENSITY MATRIX FROM X-RAY-DIFFRACTION DATA

被引：73

|

作者：

CLINTON, WL

MASSA, LJ

机构：

来源：

PHYSICAL REVIEW LETTERS | 1972年 / 29卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.29.1363

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

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页码：1363 / &

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