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STUDY OF SLOW DEGRADATION IN GAALAS LEDS BY DEEP-LEVEL TRANSIENT SPECTROSCOPY
被引:0
|
作者
:
KONDO, K
论文数:
0
引用数:
0
h-index:
0
KONDO, K
YAMAKOSHI, S
论文数:
0
引用数:
0
h-index:
0
YAMAKOSHI, S
KOTANI, T
论文数:
0
引用数:
0
h-index:
0
KOTANI, T
机构
:
来源
:
FUJITSU SCIENTIFIC & TECHNICAL JOURNAL
|
1981年
/ 17卷
/ 03期
关键词
:
D O I
:
暂无
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
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页码:105 / 120
页数:16
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