EXPERIMENTAL STUDY OF ZEEMAN SPLITTING OF BORON LEVELS IN SILICON

被引：28
|
作者：
MERLET, F [1 ]
PAJOT, B [1 ]
ARCAS, P [1 ]
JEANLOUIS, AM [1 ]
机构：
[1] UNIV PARIS 06, CNRS, LAB INFRAROUGE, BATIMENT 350, 91405 ORSAY, FRANCE
来源：
PHYSICAL REVIEW B | 1975年 / 12卷 / 08期
关键词：
D O I：
10.1103/PhysRevB.12.3297
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：3297 / 3317
页数：21
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