DETERMINATION OF EFFECTIVE ELECTRON MASS IN LIGHTLY DOPED SILICON FROM MICROWAVE REFLECTIVITY

被引：4
|
作者：
PATRIN, NA
ARMSTRONG, DB
CHAMPLIN, KS
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1967年 / 38卷 / 06期
关键词：
D O I：
10.1063/1.1709986
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：2704 / +
页数：1
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