SUPERPOSITION OF AUGER-ELECTRON SPECTROSCOPY DEPTH PROFILES OBTAINED ON CR/NI MULTILAYER SAMPLES WITH DIFFERENT ROUGHNESSES

被引：12

作者：

ZALAR, A ^{[1
]}

HOFMANN, S ^{[1
]}

机构：

[1] MAX PLANCK INST MET RES, INST WERKSTOFFWISSENSCH, D-7000 STUTTGART 80, GERMANY

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1987年 / 5卷 / 04期

关键词：

D O I：

10.1116/1.574642

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1209 / 1212

页数：4

共 50 条

[31] AUGER-ELECTRON SPECTROSCOPY AND ION SPUTTER PROFILES OF OXIDES ON ALUMINUM
SMITH, T
SURFACE SCIENCE, 1976, 55 (02) : 601 - 624
[32] AUGER-ELECTRON SPECTROSCOPY OF SAMPLES REMOVED FROM MICROTOR AND MACROTOR
BAER, R
THOMAS, MT
TAYLOR, RJ
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (04): : 580 - 580
[33] COMPARISON OF DIFFERENT MODULATION TECHNIQUES FOR AUGER-ELECTRON SPECTROSCOPY
BAUER, HE
WIEDMANN, P
SEILER, H
VAKUUM-TECHNIK, 1978, 27 (07): : 194 - 196
[34] AUGER-ELECTRON SPECTROSCOPY STUDY OF NI3SI
BAKER, I
PADGETT, RA
SCHULSON, EM
SCRIPTA METALLURGICA, 1989, 23 (11): : 1969 - 1973
[35] ELECTRON-BEAM EFFECTS IN DEPTH PROFILING MEASUREMENTS WITH AUGER-ELECTRON SPECTROSCOPY
AHN, J
PERLEBERG, CR
WILCOX, DL
COBURN, JW
WINTERS, HF
JOURNAL OF APPLIED PHYSICS, 1975, 46 (10) : 4581 - 4583
[36] ION-SCATTERING SPECTROSCOPY AND AUGER-ELECTRON SPECTROSCOPY DEPTH PROFILES OF SILVER COPPER THIN-FILM INTERDIFFUSION
PITTS, JR
CZANDERNA, AW
THOMAS, TM
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 1671 - 1674
[37] INTERFACIAL DEPTH PROFILING OF SUPERCONDUCTING HIGH-T(C) MONOLAYER AND MULTILAYER STRUCTURES BY AUGER-ELECTRON SPECTROSCOPY
SEIBT, EW
ZALAR, A
PANJAN, P
SURFACE AND INTERFACE ANALYSIS, 1994, 22 (1-12) : 380 - 386
[38] AUGER-ELECTRON SPECTROSCOPY TECHNIQUE FOR NITROGEN DEPTH PROFILING IN TITANIUM COMPOUNDS
PANTEL, R
LEVY, D
NICOLAS, D
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (05): : 2953 - 2956
[39] APPLICATION OF TAILORED MODULATION TECHNIQUES TO DEPTH PROFILING WITH AUGER-ELECTRON SPECTROSCOPY
GRANT, JT
HOOKER, MP
SPRINGER, RW
HAAS, TW
SURFACE SCIENCE, 1976, 60 (01) : 1 - 12
[40] STUDY OF THE DEPTH PROFILE OF PHOSPHORUS DIFFUSION IN SILICON BY AUGER-ELECTRON SPECTROSCOPY
KOSTISHKO, BM
ORLOV, AM
LEVKINA, TG
INORGANIC MATERIALS, 1994, 30 (06) : 794 - 795

← 1 2 3 4 5 →