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- [2] Effect of process parameters on the structural characteristics of laterally grown, laser-annealed polycrystalline silicon films [J]. Voutsas, A.T. (avoutsas@sharplabs.com), 1600, American Institute of Physics Inc. (94):
- [4] ELECTRICAL AND STRUCTURAL-PROPERTIES OF SEMIINSULATING POLYCRYSTALLINE SILICON THIN-FILMS [J]. PHYSICAL REVIEW B, 1993, 47 (20): : 13561 - 13567
- [5] STRUCTURAL-PROPERTIES OF THIN POLYCRYSTALLINE SILICON FILMS [J]. DOKLADY AKADEMII NAUK BELARUSI, 1978, 22 (04): : 336 - 339
- [6] ELECTRICAL CHARACTERISTICS OF LASER-ANNEALED SILICON DIODES [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1987, 42 (04): : 273 - 277
- [8] Chapter 3 Optical and Electrical Properties of Pulsed Laser-Annealed Silicon [J]. 1600, Academic Press Inc. (23):