ERROR-CORRECTION TECHNIQUE FOR RANDOM-ACCESS MEMORIES

被引：12
|
作者：
OSMAN, FI
机构：
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1982年 / 17卷 / 05期
关键词：
D O I：
10.1109/JSSC.1982.1051834
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
下载
收藏
页码：877 / 881
页数：5
相关论文
共 50 条
  • [21] TESTABLE DESIGN OF LARGE RANDOM-ACCESS MEMORIES
    SALUJA, KK
    LE, KT
    INTEGRATION-THE VLSI JOURNAL, 1984, 2 (04) : 309 - 330
  • [22] Scaling constraints in nanoelectronic random-access memories
    Amsinck, CJ
    Di Spigna, NH
    Nackashi, DP
    Franzon, PD
    NANOTECHNOLOGY, 2005, 16 (10) : 2251 - 2260
  • [23] SELECTORS SQUEEZE DATA INTO RANDOM-ACCESS MEMORIES
    NHUYEN, TV
    ELECTRONICS, 1979, 52 (02): : 147 - 147
  • [24] On internal organization in compressed random-access memories
    Franaszek, PA
    Robinson, JT
    IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 2001, 45 (02) : 259 - 270
  • [25] A PROGRAMMING TOOL FOR EXPERIMENTATION WITH RANDOM-ACCESS MEMORIES
    DAUNAY, J
    LEARD, M
    REDON, J
    INTERNATIONAL JOURNAL OF ELECTRICAL ENGINEERING EDUCATION, 1983, 20 (03) : 275 - 279
  • [26] Nonvolatile random-access memories in silicon carbide
    Dimitrijev, S
    2003 IEEE CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS, 2003, : 405 - 409
  • [27] TESTING FOR COUPLED CELLS IN RANDOM-ACCESS MEMORIES
    SAVIR, J
    MCANNEY, WH
    VECCHIO, SR
    IEEE TRANSACTIONS ON COMPUTERS, 1991, 40 (10) : 1177 - 1180
  • [28] FAULT LOCALIZATION IN RANDOM-ACCESS MEMORIES.
    Gavrilov, A.A.
    Automatic Control and Computer Sciences, 1980, 14 (02) : 55 - 59
  • [29] ON-CHIP TESTING OF RANDOM-ACCESS MEMORIES
    SALUJA, KK
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1994, 5 (04): : 367 - 376
  • [30] DIRECT MEASUREMENT AND IMPROVEMENT OF LOCAL SOFT ERROR SUSCEPTIBILITY IN DYNAMIC RANDOM-ACCESS MEMORIES
    TAKAI, M
    KISHIMOTO, T
    SAYAMA, H
    OHNO, Y
    SONODA, K
    NISHIMURA, T
    KINOMURA, A
    HORINO, Y
    FUJII, K
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 99 (1-4): : 562 - 565
12345