QUANTITATIVE ELECTRON-MICROSCOPY RELATED TO CRYSTAL-LATTICE DEFECTS

被引：0

作者：

KINOSHITA, C ^{[1
]}

机构：

[1] KYUSHU UNIV 36,DEPT NUCL ENGN,HIGASHI KU,FUKUOKA 812,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1989年 / 38卷 / 01期

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中图分类号：

TH742 [显微镜];

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引用

页码：72 / 72

页数：1

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