PROSPECT AND LIMITATION OF QUANTITATIVE ELECTRON-MICROSCOPY - WEAK BEAM AND STEREO ELECTRON-MICROSCOPY

被引：0
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作者：
KIRITANI, M [1 ]
机构：
[1] NAGOYA UNIV,DEPT NUCL ENGN,CHIKUSA KU,NAGOYA,AICHI 464,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1989年 / 38卷 / 01期
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中图分类号：
TH742 [显微镜];
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页码：73 / 73
页数：1
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