PROSPECT AND LIMITATION OF QUANTITATIVE ELECTRON-MICROSCOPY - WEAK BEAM AND STEREO ELECTRON-MICROSCOPY

被引：0

作者：

KIRITANI, M ^{[1
]}

机构：

[1] NAGOYA UNIV,DEPT NUCL ENGN,CHIKUSA KU,NAGOYA,AICHI 464,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1989年 / 38卷 / 01期

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D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：73 / 73

页数：1

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