IMPROVEMENT IN SCANNING ELECTRON-MICROSCOPE GUN BRIGHTNESS AT LOW KV USING AN INTERMEDIATE EXTRACTION ELECTRODE

被引：0

作者：

YAMAZAKI, S

KAWAMOTO, H

SABURI, K

NAKATSUKA, H

BUCHANAN, R

机构：

[1] AKASHI SEISAKUSHO LTD,CPO BOX 1405,TOKYO,JAPAN

[2] INT SCI INSTRUMENTS INC,SANTA CLARA,CA

来源：

SCANNING ELECTRON MICROSCOPY | 1984年

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：23 / 28

页数：6

共 50 条

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