IMPROVEMENT IN SCANNING ELECTRON-MICROSCOPE GUN BRIGHTNESS AT LOW KV USING AN INTERMEDIATE EXTRACTION ELECTRODE

被引：0
|
作者：
YAMAZAKI, S
KAWAMOTO, H
SABURI, K
NAKATSUKA, H
BUCHANAN, R
机构：
[1] AKASHI SEISAKUSHO LTD,CPO BOX 1405,TOKYO,JAPAN
[2] INT SCI INSTRUMENTS INC,SANTA CLARA,CA
来源：
SCANNING ELECTRON MICROSCOPY | 1984年
关键词：
D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：23 / 28
页数：6
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