IMPROVEMENT IN SCANNING ELECTRON-MICROSCOPE GUN BRIGHTNESS AT LOW KV USING AN INTERMEDIATE EXTRACTION ELECTRODE

被引：0
|
作者：
YAMAZAKI, S
KAWAMOTO, H
SABURI, K
NAKATSUKA, H
BUCHANAN, R
机构：
[1] AKASHI SEISAKUSHO LTD,CPO BOX 1405,TOKYO,JAPAN
[2] INT SCI INSTRUMENTS INC,SANTA CLARA,CA
来源：
SCANNING ELECTRON MICROSCOPY | 1984年
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：23 / 28
页数：6
相关论文
共 50 条
  • [1] IMPROVEMENT IN SEM GUN BRIGHTNESS AT LOW KV USING AN INTERMEDIATE EXTRACTION ELECTRODE
    KURIHARA, Y
    NAKATSUKA, H
    YAMAZAKI, S
    JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (03): : 281 - 281
  • [2] BRIGHTNESS MEASUREMENT OF 500KV ELECTRON-MICROSCOPE GUN
    SHIMOYAM.H
    OHSHITA, A
    MARUSE, S
    MINAMIKA.Y
    JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (02): : 119 - &
  • [3] MEAN BRIGHTNESS OF ELECTRON-MICROSCOPE GUN
    SHIMOYAMA, H
    OHSHITA, A
    MARUSE, S
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1972, 11 (05) : 743 - +
  • [4] GUN BRIGHTNESS MEASUREMENTS IN A TRANSMISSION ELECTRON-MICROSCOPE
    CAPILUPPI, C
    VALDRE, U
    ULTRAMICROSCOPY, 1990, 32 (02) : 208 - 208
  • [5] TUNGSTEN FILAMENT GUN IN SCANNING ELECTRON-MICROSCOPE
    OATLEY, CW
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (12): : 1037 - 1041
  • [6] Brightness Measurement of 500kV Electron Microscope Gun
    Shimoyama, Hiroshi
    Ohshita, Akinori
    Maruse, Susumu
    Minamikawa, Yoshihisa
    1600, Oxford University Press (21):
  • [7] SEMICONDUCTOR PARAMETERS EXTRACTION USING CATHODOLUMINESCENCE IN THE SCANNING ELECTRON-MICROSCOPE
    CHAN, DSH
    PEY, KL
    PHANG, JCH
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (08) : 1417 - 1425
  • [8] ON THE IMAGE BRIGHTNESS OF THE TRENCH BOTTOM SURFACE IN A SCANNING ELECTRON-MICROSCOPE
    HARAFUJI, K
    NOMURA, N
    KOUDA, T
    JOURNAL OF APPLIED PHYSICS, 1992, 72 (07) : 2541 - 2549
  • [9] GUN SHOT RESIDUE AND FORENSIC APPLICATION OF THE SCANNING ELECTRON-MICROSCOPE
    PADEN, RS
    JOURNAL OF THE FORENSIC SCIENCE SOCIETY, 1984, 24 (04): : 453 - 454
  • [10] IMPROVEMENT OF ELECTRON-GUN BRIGHTNESS IN CONVENTIONAL SCANNING ELECTRON-MICROSCOPE (SEM) BY COATING ITS TUNGSTEN FILAMENT WITH A ZIRCONIUM CARBIDE (ZRC) THIN-FILM
    ORON, M
    GOLDSTEIN, M
    VACUUM, 1978, 28 (12) : 547 - 550
12345