ASIC DESIGN - HIGH-DENSITY ICS NEED DESIGN-FOR-TEST METHODS

被引：0
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作者：
MARKOWITZ, MC
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来源：
EDN | 1988年 / 33卷 / 24期
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：73 / &
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