CHARACTERIZATION OF CO-O THIN-FILMS BY X-RAY-FLUORESCENCE USING CHEMICAL-SHIFTS OF ABSORPTION EDGES

被引：7

作者：

SAKURAI, K ^{[1
]}

IIDA, A ^{[1
]}

GOHSHI, Y ^{[1
]}

机构：

[1] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1987年 / 26卷 / 11期

关键词：

D O I：

10.1143/JJAP.26.1937

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1937 / 1938

页数：2

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