CHARACTERIZATION OF CO-O THIN-FILMS BY X-RAY-FLUORESCENCE USING CHEMICAL-SHIFTS OF ABSORPTION EDGES

被引：7
|
作者：
SAKURAI, K [1 ]
IIDA, A [1 ]
GOHSHI, Y [1 ]
机构：
[1] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1987年 / 26卷 / 11期
关键词：
D O I：
10.1143/JJAP.26.1937
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1937 / 1938
页数：2
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