SURFACE-ROUGHNESS AND LASER DAMAGE THRESHOLD

被引：18

|

作者：

HOUSE, RA ^{[1
]}

BETTIS, JR ^{[1
]}

GUENTHER, AH ^{[1
]}

机构：

[1] USAF,WEAPONS LAB,KIRTLAND AFB,NM 87117

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1977年 / 13卷 / 05期

关键词：

D O I：

10.1109/JQE.1977.1069342

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：361 / 363

页数：3

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