SURFACE-ROUGHNESS AND LASER DAMAGE THRESHOLD

被引：18
|
作者：
HOUSE, RA [1 ]
BETTIS, JR [1 ]
GUENTHER, AH [1 ]
机构：
[1] USAF,WEAPONS LAB,KIRTLAND AFB,NM 87117
来源：
IEEE JOURNAL OF QUANTUM ELECTRONICS | 1977年 / 13卷 / 05期
关键词：
D O I：
10.1109/JQE.1977.1069342
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：361 / 363
页数：3
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