MEASUREMENT OF THE MINORITY-CARRIER LIFETIME USING AN MOS CAPACITOR

被引：0
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作者：
WEI, CY
WOODBURY, HH
机构：
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1985年 / 32卷 / 05期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：957 / 964
页数：8
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