MEASUREMENT OF THE MINORITY-CARRIER LIFETIME USING AN MOS CAPACITOR

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作者：

WEI, CY

WOODBURY, HH

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IEEE TRANSACTIONS ON ELECTRON DEVICES | 1985年 / 32卷 / 05期

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TM [电工技术]; TN [电子技术、通信技术];

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0808 ; 0809 ;

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页码：957 / 964

页数：8

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