MEASUREMENT OF MINORITY-CARRIER LIFETIME IN SILICON AT MICROWAVE FREQUENCIES USING MICROSTRIP TECHNIQUES

被引：2
|
作者：
MAKIOS, V
THOMAS, RE
机构：
来源：
ELECTRONICS LETTERS | 1971年 / 7卷 / 17期
关键词：
D O I：
10.1049/el:19710337
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：496 / &
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