A PULSED IMAGE CONVERTER FOR NANOSECOND ELECTRON-MICROSCOPY

被引：0
|
作者：
BOSTANJOGLO, O
TORNOW, RP
TORNOW, W
机构：
来源：
SCANNING MICROSCOPY | 1987年
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：197 / 203
页数：7
相关论文
共 50 条
  • [1] NANOSECOND TRANSMISSION ELECTRON-MICROSCOPY AND DIFFRACTION
    BOSTANJOGLO, O
    TORNOW, RP
    TORNOW, W
    [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1987, 20 (05): : 556 - 557
  • [2] IMAGE RECORDING IN ELECTRON-MICROSCOPY
    MCMULLAN, D
    [J]. ADVANCES IN ELECTRONICS AND ELECTRON PHYSICS, 1988, 74 : 147 - 156
  • [3] IMAGE ANALYSIS IN ELECTRON-MICROSCOPY
    FRANK, J
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1979, 117 (SEP): : 25 - 38
  • [4] LASER PULSED GAAS CATHODES FOR ELECTRON-MICROSCOPY
    SANFORD, CA
    MACDONALD, NC
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (06): : 1903 - 1907
  • [5] IMAGE-PROCESSING IN ELECTRON-MICROSCOPY
    KESSEL, M
    [J]. ULTRAMICROSCOPY, 1985, 17 (02) : 163 - 163
  • [6] COMPLEX IMAGE DETERMINATION IN ELECTRON-MICROSCOPY
    SPENCE, JCH
    [J]. OPTICA ACTA, 1974, 21 (10): : 835 - 837
  • [7] IMAGE FORCE EFFECTS IN ELECTRON-MICROSCOPY
    ECHENIQUE, PM
    HOWIE, A
    [J]. ULTRAMICROSCOPY, 1985, 16 (02) : 269 - 272
  • [8] THE IMAGE HOLOGRAPHY METHOD IN ELECTRON-MICROSCOPY
    CHEN, JW
    [J]. JOURNAL OF MODERN OPTICS, 1987, 34 (12) : 1525 - 1534
  • [9] MOLECULAR IMAGE RESOLUTION IN ELECTRON-MICROSCOPY
    UYEDA, N
    KOBAYASHI, T
    SUITO, E
    HARADA, Y
    WATANABE, M
    [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (12) : 5181 - 5189
  • [10] AN IMAGE INTENSIFIER FOR ELECTRON-MICROSCOPY OF POLYMERS
    BRATT, PW
    EVEN, WR
    CARR, SH
    [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (11): : 1222 - 1226
12345