IMAGE FORCE EFFECTS IN ELECTRON-MICROSCOPY

被引：50
|
作者：
ECHENIQUE, PM
HOWIE, A
机构：
来源：
ULTRAMICROSCOPY | 1985年 / 16卷 / 02期
关键词：
D O I：
10.1016/0304-3991(85)90082-8
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：269 / 272
页数：4
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