IMAGE ANALYSIS IN ELECTRON-MICROSCOPY

被引：15
|
作者：
FRANK, J
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1979年 / 117卷 / SEP期
关键词：
D O I：
10.1111/j.1365-2818.1979.tb00229.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：25 / 38
页数：14
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