PHOTOCONDUCTIVITY MEASUREMENTS AS A TOOL FOR THE EVALUATION OF THE DENSITY OF STATES IN AMORPHOUS-SILICON

被引：1
|
作者：
AUGELLI, V [1 ]
BERARDI, V [1 ]
MURRI, R [1 ]
SCHIAVULLI, L [1 ]
机构：
[1] GRP NAZL STRUTTURA MAT,UNITA CISM,I-70126 BARI,ITALY
来源：
PHYSICA SCRIPTA | 1988年 / 38卷 / 02期
关键词：
D O I：
10.1088/0031-8949/38/2/014
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：188 / 190
页数：3
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