DIRECT OBSERVATION OF THE THRESHOLD FOR ELECTRON HEATING IN SILICON DIOXIDE

被引:43
|
作者
DIMARIA, DJ [1 ]
FISCHETTI, MV [1 ]
TIERNEY, E [1 ]
BRORSON, SD [1 ]
机构
[1] MIT,CAMBRIDGE,MA 02139
关键词
D O I
10.1103/PhysRevLett.56.1284
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1284 / 1286
页数:3
相关论文
共 50 条
  • [31] Preparation of titanium-dioxide films by heating titanium/silicon-dioxide structures on silicon in oxygen
    Yokota, K
    Yamada, T
    MATERIALS RESEARCH INNOVATIONS, 1998, 2 (02) : 103 - 109
  • [32] DIRECT OBSERVATION OF GROWTH FRONT MOVEMENT IN ELECTRON-BEAM RECRYSTALLIZATION OF SILICON LAYER ON INSULATOR
    INOUE, T
    HAMASAKI, T
    APPLIED PHYSICS LETTERS, 1987, 50 (15) : 971 - 973
  • [33] DIRECT OBSERVATION OF CRYSTALLIZATION IN SILICON BY IN-SITU HIGH-RESOLUTION ELECTRON-MICROSCOPY
    SINCLAIR, R
    MORGIEL, J
    KIRTIKAR, AS
    WU, IW
    CHIANG, A
    ULTRAMICROSCOPY, 1993, 51 (1-4) : 41 - 45
  • [34] Direct patterning of plasma enhanced chemical vapor deposition silicon dioxide by electron beam lithography
    Brown, Devin K.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2008, 26 (06): : 2451 - 2454
  • [35] OBSERVATION OF AMORPHOUS-SILICON REGIONS IN SILICON-RICH SILICON DIOXIDE FILMS
    HARTSTEIN, A
    TSANG, JC
    DIMARIA, DJ
    DONG, DW
    APPLIED PHYSICS LETTERS, 1980, 36 (10) : 836 - 837
  • [36] ELECTRON HEATING IN SILICON-NITRIDE AND SILICON OXYNITRIDE FILMS
    DIMARIA, DJ
    ABERNATHEY, JR
    JOURNAL OF APPLIED PHYSICS, 1986, 60 (05) : 1727 - 1729
  • [37] THRESHOLD FOR ELECTRON HEATING BY 2 ELECTROMAGNETIC-WAVES
    MENDONCA, JT
    PHYSICAL REVIEW A, 1983, 28 (06): : 3592 - 3598
  • [38] Direct observation of hydrogen at defects in multicrystalline silicon
    Tweddle, David
    Hamer, Phillip
    Shen, Zhao
    Markevich, Vladimir P.
    Moody, Michael P.
    Wilshaw, Peter R.
    PROGRESS IN PHOTOVOLTAICS, 2021, 29 (11): : 1158 - 1164
  • [39] DIRECT OBSERVATION OF DISLOCATIONS IN SILICON WEB CRYSTALS
    JUNGBLUT.ED
    JOURNAL OF APPLIED PHYSICS, 1965, 36 (10) : 3112 - &
  • [40] Direct observation of the metamorphism of silicon oxide grains
    Kamitsuji, K
    Ueno, S
    Suzuki, H
    Kimura, Y
    Sato, T
    Tanigaki, T
    Kido, O
    Kurumada, M
    Kaito, C
    ASTRONOMY & ASTROPHYSICS, 2004, 422 (03): : 975 - 979