OBSERVATION OF AMORPHOUS-SILICON REGIONS IN SILICON-RICH SILICON DIOXIDE FILMS

被引:39
|
作者
HARTSTEIN, A
TSANG, JC
DIMARIA, DJ
DONG, DW
机构
关键词
D O I
10.1063/1.91341
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:836 / 837
页数:2
相关论文
共 50 条
  • [1] MICROPOROSITY OF AMORPHOUS-SILICON DIOXIDE FILMS
    REPNIKOVA, EA
    GURTOV, VA
    [J]. INORGANIC MATERIALS, 1989, 25 (07): : 965 - 967
  • [2] ATTENUATED TOTAL REFLECTANCE STUDY OF SILICON-RICH SILICON DIOXIDE FILMS
    HARTSTEIN, A
    DIMARIA, DJ
    DONG, DW
    KUCZA, JA
    [J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (07) : 3860 - 3862
  • [3] CURRENT-INDUCED DEFECT CONDUCTIVITY IN HYDROGENATED SILICON-RICH AMORPHOUS-SILICON NITRIDE
    SHANNON, JM
    ANNIS, AD
    [J]. PHILOSOPHICAL MAGAZINE LETTERS, 1995, 72 (05) : 323 - 329
  • [4] An annealing study of luminescent amorphous silicon-rich silicon oxynitride thin films
    Augustine, BH
    Hu, YZ
    Irene, EA
    McNeil, LE
    [J]. APPLIED PHYSICS LETTERS, 1995, 67 (25) : 3694 - 3696
  • [5] Memory switching in amorphous silicon-rich silicon carbide
    Shannon, JM
    Lau, SP
    [J]. ELECTRONICS LETTERS, 1999, 35 (22) : 1976 - 1977
  • [6] Optical and Structural Features of Silicon-Rich Hydrogenated Amorphous Silicon Nitride Thin Films
    Singh, Sarab Preet
    Oton, Claudio J.
    Srivastava, P.
    Ghosh, Santanu
    Prakash, G. Vijaya
    [J]. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2011, 11 (12) : 10733 - 10736
  • [7] Photonic bandgaps in patterned waveguides of silicon-rich silicon dioxide
    Neal, RT
    Zoorob, ME
    Charlton, MD
    Parker, GJ
    Finlayson, CE
    Baumberg, JJ
    [J]. APPLIED PHYSICS LETTERS, 2004, 84 (13) : 2415 - 2417
  • [8] OPTICAL-PROPERTIES OF AMORPHOUS-SILICON AND SILICON DIOXIDE
    RAVINDRA, NM
    NARAYAN, J
    [J]. JOURNAL OF APPLIED PHYSICS, 1986, 60 (03) : 1139 - 1146
  • [9] Ultrabroadband transmission measurements on waveguides of silicon-rich silicon dioxide
    Neal, RT
    Charlton, MDC
    Parker, GJ
    Finlayson, CE
    Netti, MC
    Baumberg, JJ
    [J]. APPLIED PHYSICS LETTERS, 2003, 83 (22) : 4598 - 4600
  • [10] Effect of the Nd content on the structural and photoluminescence properties of silicon-rich silicon dioxide thin films
    Debieu, Olivier
    Cardin, Julien
    Portier, Xavier
    Gourbilleau, Fabrice
    [J]. NANOSCALE RESEARCH LETTERS, 2011, 6