PHOSPHORUS DISTRIBUTION IN TASI2 FILMS BY DIFFUSION FROM A POLYCRYSTALLINE SILICON LAYER

被引:23
|
作者
PELLEG, J
MURARKA, SP
机构
关键词
D O I
10.1063/1.332208
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1337 / 1345
页数:9
相关论文
共 50 条
  • [3] Boron diffusion in TaSi2 thin films
    Marmelstein, R
    Sinder, M
    Pelleg, J
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1998, 168 (01): : 223 - 229
  • [4] OXIDATION OF TASI2 THIN-FILMS ON POLYCRYSTALLINE SI
    NGUYEN, TTA
    GUERFI, N
    VEUILLEN, JY
    DERRIEN, J
    APPLIED SURFACE SCIENCE, 1989, 41-2 : 266 - 271
  • [5] Formation of nanocrystalline structure of TaSi2 films on silicon
    Sidorenko, SI
    Makogon, YN
    Beke, DL
    Csik, A
    Dub, SN
    Pavlova, EP
    Zelenin, OV
    POWDER METALLURGY AND METAL CERAMICS, 2003, 42 (1-2) : 14 - 18
  • [6] Formation of Nanocrystalline Structure of TaSi2 Films on Silicon
    Sergei I. Sidorenko
    Powder Metallurgy and Metal Ceramics, 2003, 42 : 14 - 18
  • [7] OXIDATION OF TASI2 THIN-FILMS ON POLYCRYSTALLINE TANTALUM
    RINGEISEN, F
    ALAOUI, M
    BOLMONT, D
    KOULMANN, JJ
    APPLIED SURFACE SCIENCE, 1992, 62 (03) : 167 - 173
  • [8] EFFECTS OF DOPANTS AND EXCESS SILICON ON THE OXIDATION OF TASI2/POLYCRYSTALLINE SILICON STRUCTURES
    LIU, R
    MURARKA, SP
    PELLEG, J
    JOURNAL OF APPLIED PHYSICS, 1986, 60 (09) : 3335 - 3342
  • [9] Investigation of nanostructure and mechanical properties of TaSi2 films on silicon
    Sidorenko, SI
    Makogon, YM
    Dub, SM
    Pavlova, OP
    Beke, DL
    Chik, A
    Zelenin, OV
    METALLOFIZIKA I NOVEISHIE TEKHNOLOGII, 2003, 25 (06): : 737 - 745
  • [10] Electrical, and compositional properties of TaSi2 films
    Ravindra, NM
    Jin, L
    Ivanov, D
    Mehta, VR
    Dieng, LM
    Popov, G
    Gokce, OH
    Grow, J
    Fiory, AT
    JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (10) : 1074 - 1079