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- [6] SOME ASPECTS OF SURFACE-ROUGHNESS IN POLYCRYSTALLINE THIN-FILMS - OPTICAL-CONSTANTS AND GRAIN DISTRIBUTION[J]. VACUUM, 1992, 43 (12) : 1201 - 1205BHATTACHARYYA, DCHAUDHURI, SPAL, AKBHATTACHARYYA, SK
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- [8] EFFECT OF SURFACE-ROUGHNESS ON THE VALUES OF METAL OPTICAL-CONSTANTS DETERMINED BY THE ELLIPSOMETRY METHOD[J]. OPTIKA I SPEKTROSKOPIYA, 1982, 52 (06): : 1046 - 1051ZORIN, ZMCHURAEVA, MN
- [9] ULTRAVIOLET-VISIBLE ELLIPSOMETRIC SPECTRA AND OPTICAL-CONSTANTS OF SPUTTERED AMORPHOUS-SILICON[J]. CHINESE PHYSICS, 1985, 5 (01): : 171 - 175CHEN, SGJIANG, RRMO, D
- [10] INSITU DETERMINATION OF OPTICAL-CONSTANTS OF GROWING HYDROGENATED AMORPHOUS-SILICON FILM BY P-POLARIZED LIGHT REFLECTANCE MEASUREMENT ON THE SURFACE[J]. JOURNAL OF APPLIED PHYSICS, 1993, 73 (11) : 7987 - 7989TAKANO, AKAWASAKI, MKOINUMA, H