DETERMINATION OF THE WIDTH AND COMPOSITION OF THIN EPITAXIAL GA1-XALXSB LAYERS ON GASB SUBLAYERS BY THE X-RAY SPECTRAL MICROANALYSIS METHOD

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作者：
BERNER, AI
KOSTYLEVA, OP
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IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA | 1986年 / 50卷 / 09期
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O4 [物理学];
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0702 ;
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页码：1707 / 1709
页数：3
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