共 50 条
- [33] ELLIPSOMETRY - A METHOD FOR THE CHARACTERIZATION OF THIN-FILMS BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1981, 85 (10): : 847 - 851
- [38] SPECTROPHOTOMETRIC DETERMINATION OF NICKEL FOR ANALYSIS OF COMPOSITION OF CHROMIUM-NICKEL THIN-FILMS ZEITSCHRIFT FUR CHEMIE, 1974, 14 (10): : 408 - 410
- [40] Composition of β-FeSi2 thin-films grown by a pulsed laser deposition method PROGRESS IN SEMICONDUCTORS II- ELECTRONIC AND OPTOELECTRONIC APPLICATIONS, 2003, 744 : 309 - 314