APPLICATIONS OF THE CONCENTRATION DEPTH PROFILING WITH PIXE

被引：2
|
作者：
JAKSIC, M
VAJIC, M
VALKOVIC, V
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 49卷 / 1-4期
关键词：
D O I：
10.1016/0168-583X(90)90226-K
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The applicability of PIXE concentration depth profiling was investigated by the variation of beam energy. The profile evaluation procedure was demonstrated by the measurements carried out on different multielement samples with known and unknown trace elements depth distribution. Application possibilities as well as the advantages and disadvantages of the technique are discussed. © 1990.
引用
收藏
页码：111 / 114
页数：4
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