A COMPARISON OF DOMAIN IMAGES OBTAINED FOR NANOPHASE ALLOYS BY MAGNETIC FORCE MICROSCOPY AND HIGH-RESOLUTION LORENTZ ELECTRON-MICROSCOPY

被引：20
|
作者：
GIBBS, MRJ
ALKHAFAJI, MA
RAINFORTH, WM
DAVIES, HA
BABCOCK, K
CHAPMAN, JN
HEYDERMAN, LJ
机构：
[1] DIGITAL INSTRUMENTS INC,SANTA BARBARA,CA
[2] UNIV GLASGOW,DEPT PHYS & ASTRON,GLASGOW G12 8QQ,LANARK,SCOTLAND
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1995年 / 31卷 / 06期
基金：
英国工程与自然科学研究理事会;
关键词：
D O I：
10.1109/20.490378
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The study of domain images in advanced magnetic materials is central to their further development and exploitation. For nanophase exchange- coupled magnetic materials, high spatial resolution is required for both topographic and magnetic imaging. In this paper we make a direct comparison of magnetic force microscopy and Lorentz microscopy, in order to establish the degree of complimentarity and agreement between the two techniques. Examples will be drawn from both hard (Nd-Fe-B) and soft (Fe-based) nanophase magnetic materials.
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页码：3349 / 3351
页数：3
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