ANALYSIS OF CRYSTAL IMAGES IN HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：0

|

作者：

TANAKA, M ^{[1
]}

ROCHER, A ^{[1
]}

AYROLES, R ^{[1
]}

JOUFFREY, B ^{[1
]}

机构：

[1] CNRS,OPT ELECTR LAB,F-31055 TOULOUSE,FRANCE

来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1979年 / 4卷 / 03期

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D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：A11 / A11

页数：1

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