HIGH-RESOLUTION ELECTRON-MICROSCOPY OF CRYSTAL DEFECTS AND SURFACES

被引：7

|

作者：

COWLEY, JM

机构：

来源：

ANNUAL REVIEW OF PHYSICAL CHEMISTRY | 1978年 / 29卷

关键词：

D O I：

10.1146/annurev.pc.29.100178.001343

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

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页码：251 / 283

页数：33

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