LATTICE DEFECT IMAGES IN HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：0
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作者：
INDENBOM, VL
TOCHILIN, SB
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来源：
KRISTALLOGRAFIYA | 1987年 / 32卷 / 03期
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暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
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页码：586 / 600
页数：15
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