COMPUTER ENHANCEMENT OF SCANNING ELECTRON MICROGRAPHS

被引：17

作者：

LEWIS, BL ^{[1
]}

SAKRISON, DJ ^{[1
]}

机构：

[1] UNIV CALIF, ELECTR RES LAB, BERKELEY, CA 94720 USA

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1975年 / CA22卷 / 03期

关键词：

D O I：

10.1109/TCS.1975.1084027

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：267 / 278

页数：12

共 50 条

[41] TECHNIQUE TO ENHANCE DETAIL ON SCANNING ELECTRON MICROGRAPHS OF GEOLOGICAL MATERIALS
TOVEY, NK
KRINSLEY, DH
GEOTECHNIQUE, 1975, 25 (01): : 146 - 152
[42] SCANNING ELECTRON-MICROGRAPHS OF CLAYSTONE ALTERING TO FLINT CLAY
KELLER, WD
CLAYS AND CLAY MINERALS, 1982, 30 (02) : 150 - 152
[43] 2-DIMENSIONAL COMPARISON OF ELECTRON MICROGRAPHS WITH COMPUTER CALCULATIONS
SPRING, MS
STEEDS, JW
PHYSICA STATUS SOLIDI, 1970, 37 (01): : 303 - &
[44] Computer simulation of Lorentz electron micrographs of thin magnetic particles
Haug, T
Otto, S
Schneider, M
Zweck, J
ULTRAMICROSCOPY, 2003, 96 (02) : 201 - 206
[45] PROCESSING OF ELECTRON-MICROGRAPHS OF RIBOSOMAL-SUBUNITS BY COMPUTER
PLEISSNER, KP
LUTSCH, G
WANGERMANN, G
STUDIA BIOPHYSICA, 1980, 79 : 117 - 118
[46] Image Enhancement by Coherent Optical Filtering of Electron Micrographs.
Block, Henri
Ernst, Gunter
Boseck, Siegfried
Optik (Jena), 1988, 79 (02): : 81 - 89
[47] 3-DIMENSIONAL MEASUREMENTS FROM SCANNING ELECTRON-MICROGRAPHS BY ELECTRON SCRIBING
SIMON, W
EDEN, M
REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (04): : 443 - 444
[48] COMPUTER IMAGE-PROCESSING FOR REDUCTION OF NOISE DUE TO PHASE-CONTRAST AND IMAGE-CONTRAST ENHANCEMENT OF ELECTRON-MICROGRAPHS WITH THE AID OF A DIGITAL SCANNING DENSITOMETER SYSTEM
BABA, N
SHINO, M
HOJOU, K
KANAYA, K
ADACHI, K
JOURNAL OF ELECTRON MICROSCOPY, 1981, 30 (03): : 261 - 262
[49] TECHNIQUES TO EVALUATE THE PERFORMANCE OF SCANNING MICRODENSITOMETERS IN THE DIGITIZATION OF ELECTRON-MICROGRAPHS
MCGEE, PA
TRUS, BL
STEVEN, AC
MICRON, 1982, 13 (02) : 221 - 228
[50] ROTATION BETWEEN MICROGRAPHS FROM SCANNING ELECTRON-MICROSCOPE AND ELECTRON CHANNELING PATTERNS
VANESSEN, CG
VERHOEVEN, JD
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (09): : 768 - 770

← 1 2 3 4 5 →