COMPUTER ENHANCEMENT OF SCANNING ELECTRON MICROGRAPHS

被引:17
|
作者
LEWIS, BL [1 ]
SAKRISON, DJ [1 ]
机构
[1] UNIV CALIF, ELECTR RES LAB, BERKELEY, CA 94720 USA
来源
关键词
D O I
10.1109/TCS.1975.1084027
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:267 / 278
页数:12
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