PICOSECOND PHOTOREFRACTIVE DIFFRACTION IN CDTE AT 1 MU-M

被引：1
|
作者：
RUCKMANN, I
KORNACK, J
KOLENDA, J
PETRAUSKAUS, M
DING, Y
SMANDEK, B
机构：
[1] VILNIUS UNIV,DEPT PHYS,VILNIUS 2054,LITHUANIA,USSR
[2] TECH UNIV BERLIN,INST OPT,W-1000 BERLIN 12,GERMANY
来源：
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1992年 / 55卷 / 01期
关键词：
D O I：
10.1007/BF00324598
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Using a ps-transient grating technique the contribution of the ps-photorefractive effect to the first-order probe-beam diffraction signal has been studied in CdTe at 1-mu-m investigating diffraction kinetics at different sample orientations in the thin grating regime. A fast photorefractive grating formation time during the pump pulses and a characteristic decay time of 600 ps, shorter than the free-carrier lifetime, have been observed.
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页码：30 / 32
页数：3
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