PICOSECOND PHOTOREFRACTIVE DIFFRACTION IN CDTE AT 1 MU-M

被引：1

作者：

RUCKMANN, I

KORNACK, J

KOLENDA, J

PETRAUSKAUS, M

DING, Y

SMANDEK, B

机构：

[1] VILNIUS UNIV,DEPT PHYS,VILNIUS 2054,LITHUANIA,USSR

[2] TECH UNIV BERLIN,INST OPT,W-1000 BERLIN 12,GERMANY

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1992年 / 55卷 / 01期

关键词：

D O I：

10.1007/BF00324598

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Using a ps-transient grating technique the contribution of the ps-photorefractive effect to the first-order probe-beam diffraction signal has been studied in CdTe at 1-mu-m investigating diffraction kinetics at different sample orientations in the thin grating regime. A fast photorefractive grating formation time during the pump pulses and a characteristic decay time of 600 ps, shorter than the free-carrier lifetime, have been observed.

引用

页码：30 / 32

页数：3

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