CHARGED-PARTICLES CAUSE MICROELECTRONICS MALFUNCTION IN SPACE

被引：10
|
作者：
MCNULTY, PJ [1 ]
机构：
[1] CLARKSON COLL TECHNOL,POTSDAM,NY 13676
来源：
PHYSICS TODAY | 1983年 / 36卷 / 01期
关键词：
D O I：
10.1063/1.2915470
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：9 / &
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