CHARGED-PARTICLES CAUSE MICROELECTRONICS MALFUNCTION IN SPACE

被引：10

|

作者：

MCNULTY, PJ ^{[1
]}

机构：

[1] CLARKSON COLL TECHNOL,POTSDAM,NY 13676

来源：

PHYSICS TODAY | 1983年 / 36卷 / 01期

关键词：

D O I：

10.1063/1.2915470

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：9 / &

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