Modeling thermal effects in submicron semiconductor devices

被引:2
|
作者
Di Stefano, Vincenza [1 ]
机构
[1] Univ Catania, Fac Sci MM FF NN, Dipartimento Matemat & Informat, Catania, Italy
关键词
Semiconductor devices; hydrodynamic models; maximum entropy principle; self-heating;
D O I
10.1685/2010CAIM482
中图分类号
O1 [数学];
学科分类号
0701 ; 070101 ;
摘要
In this paper an Extended Hydrodynamic Model for the coupled system formed by electrons and phonons has been formulated, in which the problem of the closure for the high-order moments is solved by means of the Maximum Entropy Principle of extended thermodynamics. Simulation results for a 1D n(+) - n - n(+) silicon diode are presented.
引用
收藏
页码:110 / 127
页数:18
相关论文
共 50 条
  • [21] Thermal modeling of single event burnout failure in semiconductor power devices
    Walker, DG
    Fisher, TS
    Liu, J
    Schrimpf, RD
    MICROELECTRONICS RELIABILITY, 2001, 41 (04) : 571 - 578
  • [22] Modeling thermal effects in nano-devices
    Katerina Raleva
    Dragica Vasileska
    Stephen M. Goodnick
    Tomislav Dzekov
    Journal of Computational Electronics, 2008, 7 : 226 - 230
  • [23] Fast Analytical Modeling of Dynamic Thermal Behavior of Semiconductor Devices and Circuits
    Kwok, Kai H.
    d'Alessandro, Vincenzo
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2014, 61 (04) : 1031 - 1038
  • [24] Compact Thermal Modeling of Power Semiconductor Devices with the Influence of Atmospheric Pressure
    Gorecki, Pawel
    ENERGIES, 2022, 15 (10)
  • [25] An efficient two-dimensional physical modeling of noise fluctuations in submicron and highly doped semiconductor devices
    Abou-Elnour, A
    Liebig, D
    Schunemann, K
    NOISE IN PHYSICAL SYSTEMS AND 1/F FLUCTUATIONS, PROCEEDINGS OF THE 14TH INTERNATIONAL CONFERENCE, 1997, : 43 - 46
  • [26] Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices
    Liou, JJ
    Krstic, A
    Jiang, YM
    Cheng, KT
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2003, 22 (06) : 756 - 769
  • [27] PREDICTION OF TOTAL DOSE EFFECTS ON SUBMICRON PROCESS METAL-OXIDE SEMICONDUCTOR-DEVICES
    KAMIMURA, H
    KATO, M
    JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 1991, 28 (08) : 707 - 712
  • [28] HOT-ELECTRON TRANSPORT IN SUBMICRON SEMICONDUCTOR-DEVICES
    KUIVALAINEN, P
    LINDBERG, K
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1990, 159 (02): : 827 - 835
  • [29] HEAT-GENERATION AND TRANSPORT IN SUBMICRON SEMICONDUCTOR-DEVICES
    FUSHINOBU, K
    MAJUMDAR, A
    HIJIKATA, K
    JOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASME, 1995, 117 (01): : 25 - 31
  • [30] MODELING OF SEMICONDUCTOR STRUCTURES AND DEVICES
    TARNAY, K
    PHYSICA SCRIPTA, 1981, 24 (02) : 446 - 455