共 50 条
- [31] INEXPENSIVE DIGITAL IMAGE ACQUISITION FOR SCANNING ELECTRON-MICROSCOPES REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02): : 1151 - 1153
- [33] ASYMMETRICAL SHIFT OF DARK FIELD IMAGES FROM BRIGHT FIELD IMAGE IN HIGH-RESOLUTION ELECTRON-MICROSCOPES JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (03): : 252 - 252
- [35] MINIATURE PNEUMATIC TENSILE STAGE FOR SCANNING ELECTRON-MICROSCOPES REVIEW OF SCIENTIFIC INSTRUMENTS, 1982, 53 (07): : 1097 - 1098
- [36] HYDRAULIC STRAINING STAGE FOR USE IN SCANNING ELECTRON-MICROSCOPES JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1979, 12 (06): : 464 - 466
- [37] MEASUREMENT OF LOCAL TEXTURES WITH TRANSMISSION AND SCANNING ELECTRON-MICROSCOPES TEXTURES AND MICROSTRUCTURES, 1990, 13 (01): : 15 - 30
- [38] SCANNING ELECTRON-MICROSCOPES AND OTHER BEAM INSTRUMENTS FOR SPACEFLIGHT JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1987, 7 (02): : 137 - 137
- [39] Small-size microlens characterization by multiwavelength high-resolution interference microscopy OPTICS EXPRESS, 2010, 18 (14): : 14319 - 14329
- [40] SMALL-ANGLE ELECTRON-DIFFRACTION IN ELECTRON-MICROSCOPES INDUSTRIAL LABORATORY, 1978, 44 (02): : 226 - 231