INTERNAL OPTICAL LOSS MEASUREMENTS IN 1.3-MU-M INGAASP LASERS

被引：20
|
作者：
SHTENGEL, GE
ACKERMAN, DA
机构：
[1] AT&T Bell Laboratories, Murray Hill
来源：
ELECTRONICS LETTERS | 1995年 / 31卷 / 14期
关键词：
SEMICONDUCTOR LASERS; LASERS VARIABLE MEASUREMENT;
D O I：
10.1049/el:19950764
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A highly accurate method of measuring optical loss in individual semiconductor lasers is presented and compared with other methods. Measured loss data for 1.3 mu m semiconductor lasers are presented that illustrate the suitability of this technique for studying the dependence of loss on temperature and carrier density.
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页码：1157 / 1159
页数：3
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