DETERMINATION OF THE OPTICAL-THICKNESS AND OF THE FILLING FACTOR OF DISCONTINUOUS AU FILMS FROM PHOTOMETRIC AND ELLIPSOMETRIC MEASUREMENTS

被引：8

作者：

ELIZALDE, E ^{[1
]}

GADENNE, P ^{[1
]}

THEYE, ML ^{[1
]}

机构：

[1] UNIV PIERRE & MARIE CURIE,CNRS,OPT SOLIDES LAB 781,F-75252 PARIS 05,FRANCE

来源：

OPTICS COMMUNICATIONS | 1986年 / 60卷 / 06期

关键词：

D O I：

10.1016/0030-4018(86)90076-3

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：378 / 382

页数：5

共 50 条

[21] INSITU ELLIPSOMETRIC DETERMINATION OF THICKNESS AND OPTICAL-CONSTANTS OF PASSIVE AND TRANSPASSIVE FILMS ON ALLOY 600 IN NEUTRAL SOLUTION
MATSUDA, S
KIKUCHI, T
SUGIMOTO, K
CORROSION SCIENCE, 1990, 31 : 161 - 166
[22] Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements
Peng, Chubing
Liang, Rongguang
Erwin, J. Kevin
Bletscher, Warren
Nagata, Kenichi
Mansuripur, Masud
Applied Optics, 2001, 40 (28): : 5088 - 5099
[23] In-situ ellipsometric determination of thickness and optical constants of passive and transpassive films on alloy 600 in neutral solution
Matsuda, Shiro
Kikuchi, Toshihiro
Sugimoto, Katsuhisa
Corrosion Science, 1990, 31 (pt 1): : 161 - 166
[24] DETERMINATION OF THICKNESS AND REFRACTIVE-INDEX OF THIN TRANSPARENT MULTILAYER FILMS ON SILICON FROM ELLIPSOMETRIC DATA
DOHERTY, JG
RYAN, WD
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1975, 122 (10): : 1093 - 1094
[25] Measuring Thin Transparent Films Precisely: Reliability of reflectometric measurements for optical thickness determination
Quinten, Michael
VAKUUM IN FORSCHUNG UND PRAXIS, 2019, 31 (01) : 27 - 29
[26] Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements
Cardin, Julien
Leduc, Dominique
APPLIED OPTICS, 2008, 47 (07) : 894 - 900
[27] Determination of aerosol optical thickness from measurements of spectral sky radiance
Oliveros, CS
Reyes, FJO
Alados-Arboledas, L
JOURNAL OF AEROSOL SCIENCE, 1998, 29 (10) : 1199 - 1211
[28] Determination of the thickness and optical constants of thin films from transmission spectra
Kubinyi, M
Benko, N
Grofcsik, A
Jones, WJ
THIN SOLID FILMS, 1996, 286 (1-2) : 164 - 169
[29] Determination of the thickness and optical constants of thin films from transmission spectra
Technical Univ Budapest, Budapest, Hungary
Thin Solid Films, 1-2 (164-169):
[30] DETERMINATION OF OPTICAL-CONSTANTS AND THICKNESS OF PASSIVATING FILMS ON NICKEL FROM MULTIPLE-ANGLE-OF-INCIDENCE REFLECTIVITY MEASUREMENTS
OHTSUKA, T
SCHONER, K
HEUSLER, KE
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1978, 93 (03) : 171 - 182

← 1 2 3 4 5 →