TEST BEAM STUDIES OF A SILICON MICROSTRIP VERTEX DETECTOR

被引:8
|
作者
KARCHIN, PE
HALE, DL
MORRISON, RJ
WITHERELL, MS
SOKOLOFF, MD
KIANG, A
KUMAR, BR
MARTIN, JF
SARABURA, M
机构
[1] FERMILAB,BATAVIA,IL
[2] UNIV TORONTO,TORONTO M5S 1A1,ONTARIO,CANADA
关键词
D O I
10.1109/TNS.1985.4336907
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:612 / 615
页数:4
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