TEST BEAM STUDIES OF A SILICON MICROSTRIP VERTEX DETECTOR

被引：8
|
作者：
KARCHIN, PE
HALE, DL
MORRISON, RJ
WITHERELL, MS
SOKOLOFF, MD
KIANG, A
KUMAR, BR
MARTIN, JF
SARABURA, M
机构：
[1] FERMILAB,BATAVIA,IL
[2] UNIV TORONTO,TORONTO M5S 1A1,ONTARIO,CANADA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1985年 / 32卷 / 01期
关键词：
D O I：
10.1109/TNS.1985.4336907
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：612 / 615
页数：4
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